- Products
- PowerArtistRTL Power Reduction, Analysis, Debug, and RPM Generation
- RedHawkSoC Dynamic Power, Advanced Low Power, Reliability, and Chip-Package Co-design
- TotemAnalog/Mixed-Signal Dynamic Power, Substrate Noise, EM, and ESD
- SentinelChip-Package-System Power/Signal Integrity, IO-SSO, Thermal, and EMI
- ResourcesTechnical Papers and Presentations, Contributed Articles and Conference Papers, Webinars and Videos
- Flows
- Ultra Low PowerPower methodology for ultra-low-power designs
- IP IntegrationPower methodology for IP Integration initiative
- Chip-Package-SystemPower methodology for giga-hertz performance
- Support
- Community
- CustomersServing the industry’s leading electronics companies
- PartnersFoundry, IP, EDA, Industry Alliances
- Blog
- Chip-Package-System User GroupConvergence for Power, Noise, and Reliability
- Company
- About ApacheOverview, Milestones, Achievements
- News
- Events
- Employment
- Global Offices
Resources
Ultra-Low-Power
Products Covered: PowerArtist, RedHawk, RTL Power Model (RPM)
Technical Papers and Presentations
Access to the following technical papers and presentations requires an Apache account. If you already have an account, please login. If you wish to request a new account, click on the Whitepaper you are interested in and you will be taken to the account registration page. Please allow 24 hours for access to Apache resources.
- RTL Design-for-Power Methodology
This paper presents a design-for-power methodology, beginning early in the design process at the Register Transfer Level (RTL) for maximum impact on power.
- Power Delivery Network (PDN) Verification Coverage
This paper presents a methodology for comprehensive power grid verification coverage, including identification of power grid weaknesses early in the design cycle.
- Low Power Design Analysis
This paper describes the technology and methodology for analysis of designs utilizing power- gating switches for leakage control. It describes the requirements of verifying low power designs in different modes of operation, as well as in mixture of various states.
- Electronic Power and Thermal Management
This paper presents a set of tools and methodologies that help address the challenges of power and thermal management encountered in next-generation unmanned systems.
- Ultra-Low-Power Methodology (Slides)
This presentation demonstrates how Apache enables successful design and delivery of low-power chips by offering a comprehensive flow that spans the entire design process.
- RTL Power Analysis and Reduction (Slides)
This presentation introduces PowerArtist, a complete RTL Design for Power platform enabling micro-architectural trade-off decisions from beginning at RTL, “power debug”, analysis-driven RTL power reduction , and full-chip power regressions.
- Power Integrity Verification and Signoff for Low Power Designs (Slides)
This presentation covers RedHawk’s extensive capabilities for analyzing low power designs, while considering the complexities associated with various power saving features. It also highlights the low power debug capabilities of RedHawk Explorer and solutions for chip-package-system optimization.
- PowerArtist (Slides)
This presentation provides an overview of PowerArtist, a complete RTL Design- for-Power platform with fully-integrated advanced analysis and automatic reduction technologies; delivering 10% to 60% or more power savings.
- Ultra-Low-Power Design Simulations – An RTL2Gate Approach (Slides)
This presentation provides an overview of the industry's leading RTL Design-for-Power solutions - PowerArtist and industry-standard dynamic power sign-off platform - RedHawk, along with RTL2Gate methodology on how these platforms can be used to meet complex and competing performance-power-price targets.
Contributed Articles
- Power-Efficient Semiconductor Design – ANSYS Advantage, 2012
- Design for Power Methodology – EETimes Design, 2012
- ‘Early and Accurate’ Power Analysis: Myth or Reality? – EETimes Design, 2012
- An RTL to GDSII Approach for Low Power Design: A Design for Power – EETimes Design, 2011
- The Path to Power Efficient Designs – Electronic Products, 2012
- Best in Class will Thrive in New Spending Environment – EETimes Military/Aerospace, 2011
- Design Convergences: Approaches on Handling the Coming Tsunami – EETimes Design, 2010
Conference Papers
- Power, Noise and Reliability Analysis for Automotive Electronic Systems (Slides) – Automotive Simulation World Congress 2012
- Power Noise Mitigation Strategy from RLT Perspective on MTCMOS Design (Slides) – DAC User Track, 2010
- Power Gated Design Optimization and Analysis (Slides) – DAC User Track, 2009
Webinars and Videos
- RTL Design-for-Power for Mobile SoCs: Best Practices
This Educast focuses on Register Transfer Language (RTL) best practices for low-power mobile semiconductor design including early and reliable power budgeting, reduction, debug, and regressions.
- SoC Power Budgeting Using RTL Power Models
This Educast will provide useful information regarding how PowerArtist Calibrator and Estimator (PACE) and RTL Power Models (RPM) can improve the accuracy of your RTL power estimation prior to the availability of physical implementation and manage power delivery network integrity early in the process for cost-effective IC and package design decisions.
- Ultra-Low-Power Design and Simulation Methodology: An RTL2Gate Approach
This presentation will discuss PowerArtist, the industry's leading RTL Design-for-Power solution, and RedHawk, the industry-standard dynamic power sign-off platform, along with an RTL2Gate methodology for how these platforms can be used to meet complex and competing performance-power-price targets.
Power Integrity and Sign-Off
Products Covered: RedHawk, Totem
Technical Papers and Presentations
Access to the following technical papers and presentations requires an Apache account. If you already have an account, please login. If you wish to request a new account, click on the Whitepaper you are interested in and you will be taken to the account registration page. Please allow 24 hours for access to Apache resources.
- RedHawk-3DX: Meeting Emerging Needs for Next-Generation 3D-IC and Sub-20nm Designs
This paper introduces RedHawk-3DX, fourth generation full-chip power integrity and sign-off solution re-architected to meet the accuracy and capacity demands of sub-20nm process technology and enables the simulation of multi-die / 3D-IC designs.
- Power Delivery Network (PDN) Verification Coverage
This paper presents a methodology for comprehensive power grid verification coverage, including identification of power grid weaknesses early in the design cycle.
- Low Power Design Analysis
This paper describes the technology and methodology for analysis of designs utilizing power-gating switches for leakage control. It describes the requirements of verifying low power designs in different modes of operation, as well as in mixture of various states.
- Excel2IR Early Design Analysis and Power Grid Prototyping Utility
This paper outlines an analysis methodology enabling early-stage design closure, with consideration for power grid parameter checks, such as required number and location of pads and power gates, power grid metal density used vs. reliability, and IR-drop targets.
- Technologies for Power, Signal, Thermal, and EMI Sign-off
This paper discusses the challenges associated with designing smaller, faster, and lower cost products. It provides an overview of Apache's power and noise solutions and how these products enable comprehensive chip-package-system convergence flow across multiple design disciplines.
- Power and Noise Integrity for Analog/Mixed-Signal Designs
This paper describes the need for power noise integrity solution for analog / mixed-signal designs and the benefits of the Totem platform, its usage model in a design flow, and results from simulation and correlation measurements.
- Electronic Power and Thermal Management
This paper presents a set of tools and methodologies that help address the challenges of power and thermal management encountered in next-generation unmanned systems.
- Power Noise Analysis with Silicon Correlation Results for Complex ASIC Designs (Slides)
This presentation outlines the on-chip power distribution networks (PDN) design and power integrity simulation for Ciena's complex 65nm and 32nm ASIC with 30+ million gates.
- Full-chip Substrate Noise Coupling Analysis and Noise Isolation Structure Design Experiments (Slides)
This presentation provides a case study using Totem-CSE for modeling and simulating the impact of substrate noise coupling at the full-chip level on NXP’s 65nm test-chip.
- Power Integrity Verification and Signoff for Low Power Designs (Slides)
This presentation covers RedHawk’s extensive capabilities for analyzing low power designs, while considering the complexities associated with various power saving features. It also highlights the low power debug capabilities of RedHawk Explorer and solutions for chip-package-system optimization.
- IP Integration and SoC Sign-off for Power, Noise and Reliability (Slides)
This presentation demonstrates how Apache's IP Integration methodology enables successful integration of IPs on highly integrated mixed-signal SoCs by considering the power noise impact of sensitive analog circuitry with high-speed digital logic on the same piece of silicon
- RedHawk™ - SoC Power Integrity and Sign-off for 28-nm Designs (Slides)
This presentation discusses how RedHawk enables designers to explore and identify physical design weaknesses, automatically repair the source of supply noise, analyze the impact of dynamic voltage drop on timing and jitter, verify power and signal EM, and provide a model of the chip's power delivery network for system-level analysis.
- Totem™ - Analog/Mixed-Signal Power Noise and Reliability (Slides)
This presentation demonstrates how Totem addresses the challenges associated with global coupling of power/ground noise, substrate noise, and package/PCB capacitive and inductive noise for memory components, high-speed I/Os and analog circuit designs. It also discusses Totem’s ability to create a protected model representing accurate power profile of the IP for mixed-signal design verification.
- RedHawk-3DX (Slides)
This presentation provides an overview of RedHawk-3DX, the fourth generation full-chip power integrity and sign-off solution. It is re-architected to meet the accuracy and capacity demands of sub-20nm process technology and enables the simulation of multi-die / 3D-IC designs.
- Totem (Slides)
This presentation provides an overview of Totem, a full-chip, layout-based power and noise platform for analog and mixed-signal designs. It addresses the challenges associated with global couplings of power / ground noise, substrate noise, and package / PCB capacitive and inductive noise for memory components (Flash and DRAM), high-speed I/Os (HDMI and DDR), and analog circuits (power management ICs).
Contributed Articles
- The Path to Power-efficient Designs – Electronic Products, 2012
- A Modeling Approach to Power Integrity Simulation in 3D-IC Designs – EETimes Design, 2012
- Understanding Power Integrity as a System Wide Challenge – Electronic Design, 2012
- Electronic System Design Consideration Meet Emerging Market Needs – GSA Forum, 2011
- Design Convergences: Approaches on Handling the Coming Tsunami – EETimes Design, 2010
- A New Approach to Power Noise Analysis in Analog/Mixed-Signal Designs – ChipEstimate, 2011
- System-level Power Distribution Noise Closure: Looking Beyond the SoC Power Integrity Challenge – DAC Knowledge Center, 2010
- Power Delivery Network Design Requires Chip-Package-System Co-design Approach – EDA Design Line, 2010
Conference Papers
- Power, Noise and Reliability Analysis for Automotive Electronic Systems (Slides) – Automotive Simulation World Congress 2012
- Modeling and Simulation Challenges in 3D Memories (Slides) – DesignCon, 2012
- HVCOM Model for Graphics IP IR-Drop Analysis (Slides) – DAC User Track. 2012
- On-chip Noise Coupling Analysis with Totem-CSE (Slides) – DAC User Track, 2012
- Ensuring On-Die Power Supply Robustness in High-Performance Designs – VLSI Design, 2011
- Power and Thermal Simulation Considerations for Stacked Die Packages (Slides) – MEPTEC, 2011
- Power Noise Mitigation Strategy from RLT Perspective on MTCMOS Design (Slides) – DAC User Track, 2010
- Analysis of Power Delivery Network of Multiple Stacked ASICs using TSV and Micro-bumps (Slides) – DAC User Track, 2010
- On-Chip Power Supply Noise and Reliability Analysis for Multi-Gigabit I/O Interfaces – DesignCon, 2010
- Power Integrity Characterization and Correlation of 3D Package Systems Using On-Chip Measurements – EPEPS, 2010
- di/dt Mitigation Method in Power Delivery Design and Analysis (Slides) – DAC User Track. 2009
- Power Gated Design Optimization and Analysis with Silicon Correlation Results (Slides) – DAC User Track, 2009
- Power Supply and Substrate Noise Analysis; Reference Tool Experience with Silicon Validation (Slides) – DAC User Track, 2009
- Worst Case Switching Pattern for Core Noise Analysis – DesignCon, 2009
- Simulation and Characterization of GHz On-Chip Power Delivery Network – DesignCon, 2008
Webinars and Videos
- SoC Power Integrity Challenges
This educast covers, challenges in IC power integrity and low-power sign-off, simulation requirements for dynamic power noise on ICs using system-aware chip simulations, and simulation requirements for system co-design using chip-aware system simulations
- RedHawk-3DX: Dynamic Power Sign-Off
This webcast introduces RedHawk-3DX, a fourth generation full-chip power integrity and sign-off solution re-architected to meet the accuracy and capacity demands of sub-20nm process technology and enables the simulation of multi-die / 3D-IC designs
- RedHawk-3DX: Fourth Generation Power Sign-off Solution Architected for 3D-IC Designs
This presentation focuses on Apache's latest generation of the RedHawk platform - RedHawk-3DX - with direct support for multi-die simulation, including a brand new multi-pane, multi-canvas graphical user interface, its hierarchical dynamic simulation capabilities, new logic and activity propagation engines, and the ability to model and simulate LDOs.
- Power and Reliability Sign-off
This video presents on power and reliability sign-off using RedHawk and Totem in GlobalFoundries advanced 28nm low-power process
- Power Issues for Chip and Board
This webinar discusses power management issues for mobile devices including increasing chip densities, a rise in the levels of concurrency, power consumption, power dissipation, heat dissipation, and power integrity.
- Power Issues Ahead
This video talks about growing concerns over electrostatic discharge, electromigration, the impact of stacked die, and the need for power and thermal models.
Chip-Package-System
Products Covered: RedHawk, Chip Power Model (CPM), Sentinel-PSI, Sentinel-SSO, Sentinel- TI
Technical Papers and Presentations
Access to the following technical papers and presentations requires an Apache account. If you already have an account, please login. If you wish to request a new account, click on the Whitepaper you are interested in and you will be taken to the account registration page. Please allow 24 hours for access to Apache resources.
- Optimizing Cost-Performance-Schedule with Chip-Package-System Methodology
This paper provides an overview of the Chip-Package-System methodology and describes the approach to help meet power performance and price targets.
- ANSYS and Apache Technologies for an Integrated Chip-Package-System Flow
This paper presents solutions for effectively managing design specifications (performance) and margins (price). It discusses solutions based on accurate and predictive simulation software from ANSYS and Apache that offers electronics designers a simulation-driven chip–package–system convergence methodology.
- Advanced Modeling Technologies for Chip, Package, System Co-analysis and Co-optimization
This paper presents a comprehensive chip-package-system (CPS) co-analysis and co-optimization methodology that helps meet increasing demands for system cost down. It outlines the Chip Power Model (CPM™) technologies and solutions available from Apache Design to help address the CPS convergence challenge.
- Technologies for Power, Signal, Thermal, and EMI Sign-off
This paper discusses the challenges associated with designing smaller, faster, and lower cost products. It provides an overview of Apache's power and noise solutions and how these products enable comprehensive chip-package-system convergence flow across multiple design disciplines.
- Electronic Power and Thermal Management
This paper presents a set of tools and methodologies that help address the challenges of power and thermal management encountered in next-generation unmanned systems.
- Simultaneous SI and PI Analysis for High Speed I/O Designs for Mobile Applications (Slides)
This presentation provides an overview of a simulation methodology that simultaneously includes the switching impact of an entire bank of IO cells along with the associated IO ring PDN parasitics, the package and PCB parasitics including the coupling between power and signal nets, and the parasitics of the termination logic.
- Chip Power Model: Next Generation Power Modeling Capabilities (Slides)
This presentation discusses the Chip Power Model (CPM) technology, along with examples of how it is used for chip-package-system convergence. The newest functionality is presented with details on how it can provide greater verification and sign- off coverage, as well as resonance frequency aware CPM and chip-level probing in a chip-package-system simulation.
- Sentinel™-PSI - IC-Package Power and Signal Integrity Solution (Slides)
This presentation discusses Sentinel-PSI, which provides the accuracy of a conventional full-wave tool, with the capacity to handle an entire package or board design to perform system-level I/O-SSO simulations.
- IO Sub-system Timing and Jitter Analysis Considering Power and Signal Noise Impact (Slides)
This presentation discusses the Sentinel-SSO analysis methodology for generating accurate timing and jitter numbers with the inclusion of IO, package, and board elements, as well as the consideration of both power/ground and signal networks.
- Low-Power Design Closure with Chip-Package-System (Slides)
This presentation provides an overview of 'system-aware' chip design and 'chip-aware' system design methodologies and how they address complex power and signal integrity, thermal, and electromagnetic interference (EMI) design requirements.
- Sentinel-PSI (Slides)
This presentation provides an overview of Sentinel-PSI, a 3D full-wave electromagnetic solver for power and signal integrity analysis of package and PCBs, with the ability to perform DC, AC, and transient simulations from a single environment.
- Sentinel-SSO (Slides)
This presentation provides an overview of Sentinel-SSO, a high-capacity I/O sub-system timing and noise analysis solution targeted for IC and package SI designers.
Contributed Articles
- A Modeling Approach to Power Integrity Simulation in 3D-IC Designs – EETimes Design, 2012
- The Path to Power-efficient Designs – Electronic Products, 2012
- Understanding Power Integrity as a System-Wide Challenge – Electronic Design, 2012
- Best in Class will Thrive in New Spending Environenmt – EETimes Military/Aerospace, 2011
- Electronic System Design Considerations to Meet Emerging Market Needs – GSA Forum, 2011
- System-level Power Distribution Noise Closure: Looking Beyond the SoC Power Integrity Challenge – DAC Knowledge Center, 2010
- Design Convergences: Approaches on Handling the Coming Tsunami – EETimes Design, 2010
- Power Delivery Network Design Requires Chip-Package-System Co-design Approach – EDA DesignLine, 2010
Conference Papers
- Thermal Co-analysis of 3D-IC/Packages/System – DesignCon, 2013
- Thermal Co-analysis of 3D-IC/Packages/System (Slides) – DesignCon, 2013
- Extraction and Simulation of Complex Silicon Interposer Structures with measurement Correlation (Slides) - GIT 2012
- Power, Noise and Reliability Analysis for Automotive Electronic Systems (Slides) – Automotive Simulation World Congress 2012
- Practical Considerations in Selection of 2.5D/3D Package Solutions (Slides) – DesignCon, 2012
- Modeling and Simulation Challenges in 3D Memories (Slides) – DesignCon, 2012
- Chip-Package Co-design Time and Frequency Domain Analysis (Slides) – ISQED, 2012
- Challenges for Power, Signal, and Reliability Verification on 3D-IC/Silicon Interposer Designs (Slides) – CPMT, 2011
- Power and Thermal Simulation Considerations for Stacked Die Packages (Slides) – MEPTEC, 2011
- IC-Package Thermal Co-Analysis in 3D IC Environment – InterPACK, 2011
- Analysis of Power Delivery Network of Multiple Stacked ASICs using TSV and Micro-bumps (Slides) – DAC User Track, 2010
- An Accurate and Efficient SSO/SSN Simulation Methodology for 45nm LPDDR I/O Interface (Slides) – DAC User Track, 2010
- Block Level Analysis of Chip and System Level Resonance – DesignCon, 2010
- Chip - Package - PC Board Codesign (Slides) – DAC User Track, 2009
- Worst Case Switching Pattern for Core Noise Analysis – DesignCon, 2009
- Electromagnetic Interference Reduction on an Automotive Microcontroller (Slides) – DAC User Track, 2009
- Layout-based Chip Emission Models Using RedHawk – EMC Compo, 2009
- Development and Validation of a Microcontroller Model for EMC – EMC Europe, 2008
Webinars and Videos
- ANSYS with Apache: A Chip–Package–System (CPS) Solution
In this webinar, ANSYS and Apache discuss CPS and how designers of low-power mobile products, data center equipment, consumer and computing electronics, and aerospace and automotive electronics can now accurately predict electronic system performance long before lab system integration. It will cover how best-in-class IC dynamic power extraction tools from Apache coupled to the best-in-class physical extraction simulators from ANSYS provide full electromagnetic extraction, SI/PI/EMI analysis, and thermal and mechanical stress simulation
- How to Achieve Performance, Power and Price Targets with Chip-Package-System Methodology
This presentation provides an overview of 'system-aware' chip design and 'chip-aware' system design methodologies and how they address complex power and signal integrity, thermal and electromagnetic interference (EMI) design requirements.
- Power Issues Ahead
This video talks about growing concerns over electrostatic discharge, electromigration, the impact of stacked die, and the need for power and thermal models.
Advanced Reliability
Products Covered: RedHawk, Totem, PathFinder, Sentinel
Technical Papers and Presentations
Access to the following technical papers and presentations requires an Apache account. If you already have an account, please login. If you wish to request a new account, click on the Whitepaper you are interested in and you will be taken to the account registration page. Please allow 24 hours for access to Apache resources.
- Power and Signal Line Electromigration Reliability Validation Challenges
This paper describes EM integrity analysis for power and signal lines. It outlines the various process and design trends that are increasing the likelihood of EM induced failures and looks at conventional verification techniques for EM integrity and contrasts those with what is required for advanced process nodes.
- PathFinder™: Solution for Full-chip IC ESD Integrity
This paper describes how PathFinder helps designers meet ESD guidelines and identify “weak” areas of the design most vulnerable to ESD failures. It also demonstrates how PathFinder can be used for early prototyping and design exploration, especially when clamp cells are inserted inside the core region of the chip.
- Technologies for Power, Signal, Thermal, and EMI Sign-off
This paper discusses the challenges associated with designing smaller, faster, and lower cost products. It provides an overview of Apache's power and noise solutions and how these products enable comprehensive chip-package-system convergence flow across multiple design disciplines.
- Electronic Power and Thermal Management
This paper presents a set of tools and methodologies that help address the challenges of power and thermal management encountered in next-generation unmanned systems.
- PathFinder™: Full-chip ESD Integrity and Macro-level Dynamic ESD (Slides)
This presentation introduces PathFinder, the industry's first comprehensive layout-based electrostatic discharge integrity solution providing integrated modeling, extraction, and simulation capabilities that enable an entire IC analysis highlighting susceptible areas for ESD-induced failures.
- ESD Integrity and Verification using PathFinder (Slides)
This presentation describes ESD verification methodology at the full-chip and IP levels from early stage to sign off using PathFinder, the industry’s first ESD physical integrity solution. The presentation includes discussions on static rule based resistance checks and current density checks.
- Reliability Analysis and Modeling for SoC and Custom Designs (Slides)
This presentation describes EM analysis methodology of digital (SoC/ASIC) and custom/analog (IPs/macro) designs using Apache’s RedHawk and Totem platforms, a comprehensive analysis framework for accurate power and signal EM verification. The presentation will include discussions on advanced process and foundry EM rules, as well as self-heat analysis.
- ESD Dynamic Methodology for Diagnosis and Predictive Simulation of HBM/CDM Events (Slides)
This presentation discusses a comprehensive ESD dynamic methodology for failure diagnosis and predictive simulation with real HBM and CDM application examples. The methodology focuses on dynamic analysis including modeling of die-level metal grid, substrate grid and well diode, package effective capacitance, and pogo pin.
- Reliability Analysis for 28/20nm (Slides)
This presentation provides an overview of the evolution of reliability challenges for advanced technology nodes, along with the methodology for how to address these issues using Apache's comprehensive reliability modeling and simulation solutions for power and signal EM, full-chip ESD and thermal-stress integrity.
Contributed Articles
- Design for Reliability – The Golden Age of Simulation Driven Product Design - EETimes Design, 2012
- Design Convergences: Approaches on Handling the Coming Tsunami - EETimes Design, 2012
- A New Approach to Power Noise Analysis in Analog/Mixed-Signal Designs – ChipEstimate, 2011
Conference Papers
- Comprehensive Layout-based ESD Check Methodology with Fast Full-chip Static and Macro-level Dynamic Solutions (Slides) - VLSI Design 2013
- Power, Noise and Reliability Analysis for Automotive Electronic Systems (Slides) – Automotive Simulation World Congress 2012
- ESD Dynamic Methodology for Diagnosis and Predictive Simulation of HBM/CDM Events (Slides) - EOS/ESD 2012
- Power and Thermal Simulation Considerations for Stacked Die Packages (Slides) – MEPTEC, 2011
- IC-Package Thermal Co-Analysis in 3D IC Environment – InterPACK, 2011
- On-chip Power Supply Noise and Reliability Analysis for Multi-Gigabit I/O Interfaces – DesignCon, 2010
- Electromagnetic Interference Reduction on an Automotive Microcontroller (Slides) - DAC User Track, 2009
- Layout-based Chip Emission Models using RedHawk – EMC Compo, 2009
- Development and Validation of a Microcontroller Model for EMC - EMC Europe, 2008
Webinars and Videos
- Design for Reliability - An IC Perspective
This webcast discusses the various reliability phenomena that affect the design of advanced ICs and electronic sub-systems, as well as the various technology drivers and multi- physics simulation requirements for IC reliability analysis.
- Reliability Analysis for 28/20nm Electromigration (EM) and Electrostatic Discharge (ESD)
In this presentation, an overview of the evolution of reliability challenges for advanced technology nodes will be provided, along with a methodology for addressing these issues using Apache's comprehensive reliability modeling and simulation solutions for power and signal EM, full-chip ESD and thermal-stress integrity.
- Power and Reliability Sign-off
This video presents on power and reliability sign-off using RedHawk and Totem in GlobalFoundries advanced 28nm low-power process
